4. Dynamic information storage or retrieval
  5. Condition indicating, monitoring, or testing

Jeremy B. Gaylord

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Camera sensor identifier via etched flaw

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate

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Imager linked with image processing station

Television – Camera – system and detail – Camera connected to computer
Reexamination Certificate

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Method and apparatus for improving image signals

Television – Camera – system and detail – Optics
Reexamination Certificate

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Method and apparatus for reporting programming selections...

Dynamic information storage or retrieval – Condition indicating – monitoring – or testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2142842

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