4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Housing or package
  6. For plural devices

James L. Crozier

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Component stacking in multi-chip semiconductor packages

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – For plural devices
Patent

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Voltage stress testable embedded dual capacitor structure...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1433551

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