4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

James Ebel

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Lens inspection system and method

Optics: measuring and testing – Lens or reflective image former testing – For optical transfer function
Patent

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Method and system for inspecting optical devices

Optics: measuring and testing – Lens or reflective image former testing
Reexamination Certificate

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Method and system for inspecting packages

Image analysis – Applications – Manufacturing or product inspection
Patent

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Method and system for inspecting packages

Image analysis – Applications – Manufacturing or product inspection
Patent

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Profile ID: LFUS-PAI-P-703613

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