4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Ivan-Pierre Batinic

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Built-in spare row and column replacement analysis system...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Field programmable gate array with program encryption

Electrical computers and digital processing systems: support – Data processing protection using cryptography – Tamper resistant
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Partitionable embedded circuit test system for integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2125339

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