Irakli Kiknnadze

Examiner

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Details Irakli Kiknnadze Irakli Kiknnadze

: X-ray or gamma ray systems or devices
: Specific application
: Diffraction, reflection, or scattering analysis

: Examiner
: active

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X-ray reflectance measurement system with adjustable resolution

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Reexamination Certificate

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Profile ID: LFUS-PAI-P-2798948

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