Insystems, Inc.

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Inspection system for array of microcircuit dies having redundan

Radiant energy – Photocells; circuits and apparatus – Interference pattern analysis
Patent

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Inspection system for array of microcircuit dies having redundan

Radiant energy – Photocells; circuits and apparatus – Interference pattern analysis
Patent

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Method and apparatus for detecting defect information in a holog

Image analysis – Histogram processing – For setting a threshold
Patent

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Positioning alignment apparatus and method using holographic opt

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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Rotatable and translatable mounting mechanism for a specimen pat

Patent

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