4. Thermal measuring and testing
  5. Temperature measurement
  6. In spaced noncontact relationship to specimen

Insik Kim

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Thermopile detector and method for fabricating the same

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal
Reexamination Certificate

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Thermopile detector and method for fabricating the same

Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2142903

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