4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Infineon Technologies Richmond, LP.

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Advanced bit fail map compression with fail signature analysis

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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System and method for enhanced monitoring of an etch process

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
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