4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Ido Holcman

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Method for determining the internal orientation of a wafer

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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On-the-fly automatic defect classification for substrates...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2049633

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