4. Image analysis
  5. Pattern recognition
  6. Feature extraction

Ick-Hoon Jang

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Device and method for correcting skew of an object in an image

Image analysis – Image transformation or preprocessing – Measuring image properties
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device and method for detecting blurring of an image

Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Preprocessing device and method for recognizing image...

Image analysis – Pattern recognition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Ick-Hoon Jang does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Ick-Hoon Jang, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ick-Hoon Jang will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2419455

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure