4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Hun Kil Cho

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active

Clamp for pattern recognition

Active solid-state devices (e.g. – transistors – solid-state diode – Lead frame – With structure for mounting semiconductor chip to lead frame
Reexamination Certificate

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Pattern recognition method

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2925945

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