4. Image analysis
  5. Pattern recognition
  6. Classification

Hsin-Ying Ou

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Chip design-in aid apparatus and method thereof

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Chip design-in aid apparatus and method thereof

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Image processing method and apparatus thereof

Image analysis – Pattern recognition – Classification
Reexamination Certificate

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Method and a device for processing digital image

Image analysis – Image compression or coding
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Profile ID: LFUS-PAI-P-2387514

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