4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Hsi-Hsiang Lin

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Anti-electron reflector arrangement

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate

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Atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2594476

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