4. Measuring and testing
  5. Vibration
  6. By mechanical waves

Hironori Ishii

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Battery mounted integrated circuit device having diffusion...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate

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Tube flaw detecting method using two probes

Measuring and testing – Vibration – By mechanical waves
Patent

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Profile ID: LFUS-PAI-P-1809838

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