4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Hirokazu Yokoyama

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Defect inspection method and defect inspection apparatus

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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High-pressure pump having small initial axial force of a...

Pumps – Expansible chamber type – Biasing means effects induction stroke of abutment driven,...
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Method and apparatus for inspecting defects

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Tube structure of multitubular heat exchanger

Heat exchange – Tubular structure
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Profile ID: LFUS-PAI-P-2766405

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