4. Semiconductor device manufacturing: process
  5. Coating of substrate containing semiconductor region or of...
  6. Insulative material deposited upon semiconductive substrate

Hirofumi Funahashi

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Diaphragm-type semiconductor device and method for...

Measuring and testing – Fluid pressure gauge – Diaphragm
Reexamination Certificate

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Electrical capacitance pressure sensor having electrode with...

Measuring and testing – Fluid pressure gauge – Diaphragm
Reexamination Certificate

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Magnetic impedance device, sensor apparatus using the same...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device
Reexamination Certificate

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Method of manufacturing semiconductor device

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate

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METHOD OF MEASURING A CHARACTERISTIC OF A CAPACITIVE TYPE OF...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Profile ID: LFUS-PAI-P-2108354

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