4. Television
  5. Monitoring, testing, or measuring
  6. Test signal generator

Hirobumi Inoue

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Analysis method and analysis apparatus of designing...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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High-frequency probe capable of adjusting characteristic...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Longitudinal type high frequency probe for narrow pitched...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method for fabricating probe tip portion composed by coaxial...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Process for manufacturing high frequency multichip module...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1898667

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