4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Signal converting, shaping, or generating
  6. Particular stable state circuit

Hiroaki Sugano

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Semiconductor device test circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Semiconductor integrated circuit which contains scan circuits of

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit
Patent

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Profile ID: LFUS-PAI-P-1212743

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