4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Hiroaki Kakuma

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Measurement position determination on a semiconductor wafer

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method of and apparatus for inspecting conductive pattern on pri

Image analysis – Histogram processing – For setting a threshold
Patent

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Method of and apparatus for inspecting conductive pattern on pri

Image analysis – Histogram processing – For setting a threshold
Patent

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Method of and apparatus for inspecting conductive pattern on pri

Image analysis – Histogram processing – For setting a threshold
Patent

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Profile ID: LFUS-PAI-P-983828

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