4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Hideyuki Hanafusa

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Method and apparatus for detection of surface defects of hot met

Image analysis – Histogram processing – For setting a threshold
Patent

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Method and apparatus for displaying defect in central area of mo

Image analysis – Histogram processing – For setting a threshold
Patent

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Method of examining the surface of a continuously cast metal str

Metal founding – Process – With measuring – testing – inspecting – or condition determination
Patent

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Profile ID: LFUS-PAI-P-829842

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