4. Optics: measuring and testing
  5. By dispersed light spectroscopy
  6. Utilizing a spectrometer

Hideo Takizawa

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Contrast control based on mean and deviation values

Facsimile and static presentation processing – Facsimile – Specific signal processing circuitry
Patent

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Laser length measuring instrument

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Numerical-simulation method for rotary metal forming,...

Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1106486

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