4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Hidekazu Mimura

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High precision posture control method of X-ray mirror

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Ultra precision profile measuring method

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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X-ray condensing method and its device using phase...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2180563

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