4. Television
  5. Special applications
  6. Flaw detector

Hidehito Yokomori

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Method and apparatus for probe testing substrate

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Monitor device and monitor method

Television – Special applications – Flaw detector
Patent

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Profile ID: LFUS-PAI-P-473455

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