4. Optics: measuring and testing
  5. Sample, specimen, or standard holder or support

Hajime Industries

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Defect judgement method

Image analysis – Histogram processing – For setting a threshold
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Inspection method and apparatus

Facsimile and static presentation processing – Facsimile – Specific signal processing circuitry
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Powder material inspection apparatus

Optics: measuring and testing – Sample – specimen – or standard holder or support
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