4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

Greg E. Bridges

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Method and apparatus for sub-micron imaging and probing on...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Multi-pulse sampling of signals using electrostatic force sampli

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent

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Non-contact measurement of electrical waveforms on the surface o

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage
Patent

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Profile ID: LFUS-PAI-P-701825

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