4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Genesis Semiconductor, Inc.

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Method of and apparatus for providing look ahead column...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Method of and apparatus for sharing redundancy circuits...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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