4. Coating apparatus
  5. Gas or vapor deposition

Farro Kaveh

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Integrated electronic hardware for wafer processing control...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Integrated full wavelength spectrometer for wafer processing

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Reexamination Certificate

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Techniques for reducing particulate contamination on a substrate

Coating apparatus – Gas or vapor deposition
Patent

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Profile ID: LFUS-PAI-P-1283208

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