4. Radiant energy
  5. Inspection of solids or liquids by charged particles
  6. Positive ion probe or microscope type

Ewald Niehuis

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Method to determine depth profiles in an area of thin coating

Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Patent

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Process for operating a time-of-flight secondary-ion mass spectr

Radiant energy – Ionic separation or analysis – Ion beam pulsing means with detector synchronizing means
Patent

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Profile ID: LFUS-PAI-P-812927

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