4. Optical: systems and elements
  5. Diffraction
  6. From grating

Eric A. Shaner

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Direct detector for terahertz radiation

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor
Reexamination Certificate

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Direct detector for terahertz radiation

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor
Reexamination Certificate

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Method and apparatus for non-contact measurement of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Tunable surface plasmon devices

Optical: systems and elements – Diffraction – From grating
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2366469

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