4. Electrical transmission or interconnection systems
  5. Nonlinear reactor systems
  6. Parametrons

Eiji Inuzuka

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Image processing apparatus

Facsimile and static presentation processing – Static presentation processing – Attribute control
Patent

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Measuring devices for two-dimensional photon-caused or corpuscul

Facsimile and static presentation processing – Facsimile – Specific signal processing circuitry
Patent

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Method and apparatus for evaluating luminous efficiency

Radiant energy – Invisible radiation responsive nonelectric signalling – Luminescent device
Patent

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Semiconductor device inspection system

Image analysis – Applications – Manufacturing or product inspection
Patent

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Semiconductor device inspection system involving superimposition

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Profile ID: LFUS-PAI-P-238361

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