4. Data processing: generic control systems or specific application
  5. Specific application, apparatus or process
  6. Product assembly or manufacturing

Efrat Rozenman

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Methods and apparatus for inspecting a plurality of dies

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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System and method for process variation monitor

Image analysis – Applications – 3-d or stereo imaging analysis
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System and method for process variation monitor

Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement
Reexamination Certificate

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System and method for process variation monitor

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2805191

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