4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Edward S. Kenney

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Multichannel radiography employing scattered radiation

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Non-invasive liquid level and density gauge for nuclear power re

Induced nuclear reactions: processes – systems – and elements – Testing – sensing – measuring – or detecting a fission reactor... – Flux monitoring
Patent

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Profile ID: LFUS-PAI-P-799775

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