4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Duncan Gurley

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Data converter with integrated MEMS resonator clock

Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion
Reexamination Certificate

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Wafer test head architecture and method of use

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2424056

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