4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Douglas Michael Dewanz

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High performance, low cell stress, low power, SOI CMOS...

Static information storage and retrieval – Read/write circuit – Flip-flop used for sensing
Reexamination Certificate

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Stability test for silicon on insulator SRAM memory cells...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Stability test for silicon on insulator SRAM memory cells...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2052230

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