4. Optics: measuring and testing
  5. By polarized light examination
  6. Of surface reflection

Dorian Zahorski

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Focused beam spectroscopic ellipsometry method and system

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Focused beam spectroscopic ellipsometry method and system

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Focused beam spectroscopic ellipsometry method and system

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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High spatial resolution ellipsometry device

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Profile ID: LFUS-PAI-P-1326489

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