4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Don A. Tran

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Method and system for monitoring and controlling workpieces

Image analysis – Applications – Mail processing
Reexamination Certificate

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Method and system for monitoring and controlling workpieces

Image analysis – Applications – Mail processing
Reexamination Certificate

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Method for locating eye points on objects subject to size variat

Image analysis – Applications – Manufacturing or product inspection
Patent

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Profile ID: LFUS-PAI-P-907259

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