4. Measuring and testing
  5. Gas analysis
  6. Detector detail

Dmitri Routkevitch

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Nanostructured ceramic platform for micromachined devices...

Measuring and testing – Gas analysis – Detector detail
Reexamination Certificate

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Semiconductor and device nanotechnology and methods for...

Stock material or miscellaneous articles – Coated or structually defined flake – particle – cell – strand,... – Particulate matter
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2718646

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