4. Image analysis
  5. Learning systems
  6. Trainable classifiers or pattern recognizers

Dipankar Talukdar

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Cycle and phase accurate hardware-software coverification

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Global threshold method and apparatus

Image analysis – Learning systems – Trainable classifiers or pattern recognizers
Patent

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Profile ID: LFUS-PAI-P-587771

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