4. Measuring and testing
  5. Sampler, sample handling, etc.
  6. Capture device

Diana L. Hackenberg

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Apparatus and method for sampling ultra-pure chemical

Measuring and testing – Sampler – sample handling – etc. – Capture device
Patent

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Brushless multipass silicon wafer cleaning process for post...

Cleaning and liquid contact with solids – Processes – Including application of electrical radiant or wave energy...
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1023062

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