4. Semiconductor device manufacturing: process
  5. With measuring or testing

Deok-yong Kim

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Apparatus for detecting defects in semiconductor devices and...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of in-line monitoring for shallow pit on semiconductor su

Semiconductor device manufacturing: process – With measuring or testing
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Methods of inspecting integrated circuit substrates using...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Deok-yong Kim does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Deok-yong Kim, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Deok-yong Kim will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-1271340

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure