4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system

David Riley Whaley

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Ion-shielded focusing method for high-density electron beams...

Electric lamp and discharge devices: systems – Discharge device load with fluent material supply to the... – Electron or ion source
Reexamination Certificate

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Method for optimizing the magnetic field of a periodic permanent

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent

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Profile ID: LFUS-PAI-P-1063805

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