4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

David John Nettleton

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Stylus attachment for a metrological instrument

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Type restriction and mapping for partial materialization

Data processing: database and file management or data structures – Database design – Data structure types
Reexamination Certificate

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Profile ID: LFUS-PAI-P-338348

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