4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

David James Shuman

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Atomic force microscopy scanning methods

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning tip orientation adjustment method for atomic force...

Measuring and testing – Instrument proving or calibrating – Displacement – motion – distance – or position
Reexamination Certificate

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Scanning tip orientation adjustment method for atomic force...

Measuring and testing – Instrument proving or calibrating – Displacement – motion – distance – or position
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

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Profile ID: LFUS-PAI-P-2711920

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