4. Optics: measuring and testing
  5. By polarized light examination
  6. With light attenuation

Dag Lindquist

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Automated optical surface profile measurement system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Moiré interferometer with overlapping illumination...

Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1135945

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