4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Mechanical measurement system

Coventor, Inc.

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Characterization of microelectromechanical structures

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Reexamination Certificate

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System and method for automatic mesh generation from a...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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System and method for process-flexible MEMS design and...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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System and method for three-dimensional visualization and...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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