4. Optics: measuring and testing
  5. With sample preparation
  6. Depositing particles on optical surface

Claudio Savoia

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Contact macroradiography characterization of doped optical...

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Method of measuring the thickness of a layer of silicon...

Optics: measuring and testing – With sample preparation – Depositing particles on optical surface
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2025396

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