4. Measuring and testing
  5. Specimen stress or strain, or testing by stress or strain...
  6. By loading of specimen

Chun-Ying Wang

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Fatigue test apparatus for thin element of electronic device

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Positioning structure for a dual-use antenna and base

Communications: radio wave antennas – Antennas – With support for antenna – reflector or director
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Chun-Ying Wang does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Chun-Ying Wang, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Chun-Ying Wang will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2156949

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure