- LandOfFree
- Inventors
- X-ray or gamma ray systems or devices
- Specific application
- Diffraction, reflection, or scattering analysis
Details
Charles F. Weiland
Charles F.
Weiland
- Patent Class
X-ray or gamma ray systems or devices
- SubClass
Specific application
- SubSubClass
Diffraction, reflection, or scattering analysis
- Specialty
Examiner
- Status
active
Affiliated with
No affiliations
Also associated with
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Profile ID: LFUS-PAI-P-1252412
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