4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Charles Akum Njinda

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Apparatus and method for designing a test and modeling system fo

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Patent

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Area efficient BIST system for memories

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1669947

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