Error detection/correction and fault detection/recovery
Pulse or data error handling
Data formatting to improve error detection correction...
Examiner
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Array-built-in-self-test (ABIST) for efficient, fast,...
Data management for multi-bit-per-cell memories
Financial document processing system and method of operating...
Low power testing of very large circuits
METHOD AND CIRCUIT FOR INCLUDING PARITY BITS IN WRITE DATA...
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Profile ID: LFUS-PAI-P-2607410